(주)프로브스 연구용품 쇼핑몰

PR Series AFM Probe Contact Non-contact High Resolution Life Science Electrical Measurement	Non-contact Standard High Resolution Visualized Tip High Aspect Ratio Long Scanning High Speed Scanning High sensitivity in UHV	Force Modulation Standard High Resolution Visualized Tip High sensitivity in UHV Long Scanning	Contact Silicon 재질 Silicon Nitride 재질 Quartz 재질 Visualized Tip Long Scanning	Life Science Contact Non-contact	Visualized Tip Contact Multi Non-contact
Conductive Probe Pt 코팅 PtIr 코팅 PtSi 코팅 Au 코팅 Solid Metal Conductive Diamond 코팅	Magnetic Low Momentum Medium Momentum Low Coercivity	High Resolution Super Sharp Spike Tip	Indent & Litho DLC 코팅 Diamond 코팅	High Aspect Ratio Ratio 5:1 Ratio 10:1	Silicon Nitride Rectagular Triangular
Tipless & Array Tipless Tipless Array	Ultra High Freq. 2MHz 미만 2MHz 이상	ScanAsyst® PeakForce™ Single Cantilever Multi Cantilever	Functionalized Probe Chemical modified	Special Probe All In One SNOM SThM Plateau Probe Sphere Probe Self Sensing TERS(IR&RAMAN)	SPM Accessories Standard Sample Mica Metal Disc Carbon Tape HOPG
기타 실험용품 템 그리드 나노소재 웨이퍼(기판) & 타겟 인덴터 팁 멤브레인 센서 프로브스테이셥 팁	측정 모드별 프로브 AFM/SPM Mode	중고 연구장비 연구장비 및 기자재