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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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The 240AC series is designed for AC mode AFM imaging of standard and soft samples. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
70 nm Au on the back side of the cantilever. | |||
AFM Tip | |||
Shape | OPUS | ||
Height | 14um (12-16um) | ||
Radius | <7nm | ||
Half Cone Angle | 0° front, 35° back, <9° side | ||
AFM Cantilever | |||
Shape | Beam | ||
Length | 240um (230-250um) | ||
Width | 40um (38-42um) | ||
Thickness | 2.6um (2.1-3.1um) | ||
Force Constant | 2N/m (0.6-3.9N/m) | ||
Resonance Frequency | 70kHz (45-90kHz) | ||