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AFM/SPM PROBE
(원자현미경/주사탐침현미경 탐침)
Product Description | |||
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Probes of the 35 series have three different tapping mode cantilevers on one side of the holder chip. They can be used in various applications.
It is compatible with: Bruker / Veeco / Digital Instruments Keysight / Agilent / Molecular Imaging Asylum Research Park Systems JEOL JPK etc. |
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Coating Description | |||
Backside Al coated. Coating thickness - 30 nm. | |||
AFM Tip | |||
Shape | Rotated | ||
Height | 15um (12-18um) | ||
Radius | <8nm | ||
Full Cone Angle | 40° | ||
AFM Cantilever | |||
Cantilever A | Cantilever B | Cantilever C | |
Shape | Beam | Beam | Beam |
Length | 110um | 90um | 130um |
Width | 35um | 35um | 35um |
Thickness | 2um | 2um | 2um |
Force Constant | 8.9N/m (2.7-24N/m) | 16N/m (4.8-44N/m) | 5.4N/m (1.7-14N/m) |
Resonance Frequency | 205kHz (130-290kHz) | 300kHz (185-430kHz) | 150kHz (95-205kHz) |